Thursday 22 October 2020

Detecting early-stage failure in electric power conversion devices

Researchers used acoustic emission during power cycling tests to monitor in real time the complete failure process--from the earliest stages -- in silicon carbide Schottsky diodes. This development will help solve wear-out failure problems that are limiting advanced applications in computers, solar cells, and many other devices.

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Good vibrations: New tech may lead to smaller, more powerful wireless devices

What if your earbuds could do everything your smartphone can, but better? A new class of synthetic materials could allow for smaller devices...