Tuesday, 16 February 2021

A sharper look at the interior of semiconductors

A research team has developed a high-resolution imaging method based on extreme short-wave UV light. It can be used to examine internal structures in semiconductors non-destructively, and with nanometer precision.

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Engineers develop breakthrough method for aluminum surfaces, enabling advancements in cooling, self-cleaning and anti-icing technologies

An international team of engineers has developed an innovative, scalable method for creating topography-patterned aluminum surfaces, enhanci...