Tuesday, 16 February 2021

A sharper look at the interior of semiconductors

A research team has developed a high-resolution imaging method based on extreme short-wave UV light. It can be used to examine internal structures in semiconductors non-destructively, and with nanometer precision.

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Smart textiles and surfaces: How lightweight elastomer films are bringing tech to life

Clothes that can mimic the feeling of being touched, touch displays that provide haptic feedback to users, or even ultralight loudspeakers. ...